Measuring and testing – Vibration – By mechanical waves
Reexamination Certificate
2006-06-29
2008-12-16
Williams, Hezron E. (Department: 2856)
Measuring and testing
Vibration
By mechanical waves
C073S620000, C073S633000, C073S866500
Reexamination Certificate
active
07464596
ABSTRACT:
Apparatus, systems, and methods for inspecting a structure are provided which permit inspection of uniquely shaped structures such as fuselage frames and shear ties. Probes may be constructed from rapid prototyping. Inspection may be performed manually and may use a portable function support system for delivering fluid couplant, controlling transmit and receive functions of the inspection sensors, and delivering immediate visual analysis for an operator. Integrated ultrasonic inspection apparatus, systems, and methods facilitate fast and efficient custom inspection devices and inspecting otherwise difficult-to-inspect structures.
REFERENCES:
patent: 3534591 (1970-10-01), Phelan
patent: 3575042 (1971-04-01), Lovelace et al.
patent: 3789350 (1974-01-01), Rolle
patent: 3809607 (1974-05-01), Murray et al.
patent: 3958451 (1976-05-01), Richardson
patent: 4010636 (1977-03-01), Clark et al.
patent: 4103234 (1978-07-01), Frazier, Jr.
patent: 4117733 (1978-10-01), Gugel
patent: 4160386 (1979-07-01), Jackson et al.
patent: 4167880 (1979-09-01), George
patent: 4173897 (1979-11-01), Förstermann et al.
patent: 4173898 (1979-11-01), Förstermann et al.
patent: 4229796 (1980-10-01), Garrett
patent: 4311052 (1982-01-01), Jeffras et al.
patent: 4327588 (1982-05-01), North
patent: 4365514 (1982-12-01), Ho
patent: 4368644 (1983-01-01), Wentzell et al.
patent: 4399703 (1983-08-01), Matzuk
patent: 4466286 (1984-08-01), Berbeé et al.
patent: 4470304 (1984-09-01), Nusbickel, Jr et al.
patent: 4474064 (1984-10-01), Naruse et al.
patent: 4495587 (1985-01-01), Plante et al.
patent: 4559825 (1985-12-01), Martens
patent: 4612808 (1986-09-01), McKirdy et al.
patent: 4752895 (1988-06-01), Sarr
patent: 4755953 (1988-07-01), Geithman et al.
patent: 4774842 (1988-10-01), Kollar
patent: 4803638 (1989-02-01), Nottingham et al.
patent: 4807476 (1989-02-01), Cook et al.
patent: 4848159 (1989-07-01), Kennedy et al.
patent: 4912411 (1990-03-01), Allison et al.
patent: 4976150 (1990-12-01), Deka
patent: 5007291 (1991-04-01), Walters et al.
patent: 5047771 (1991-09-01), Engeler et al.
patent: 5050703 (1991-09-01), Graff et al.
patent: 5062301 (1991-11-01), Aleshin et al.
patent: 5148414 (1992-09-01), Graff et al.
patent: 5164921 (1992-11-01), Graff et al.
patent: 5241135 (1993-08-01), Fetzer
patent: 5396890 (1995-03-01), Weng
patent: 5417218 (1995-05-01), Spivey et al.
patent: 5421203 (1995-06-01), Graff et al.
patent: 5485084 (1996-01-01), Duncan et al.
patent: 5535628 (1996-07-01), Rutherford
patent: 5567881 (1996-10-01), Myers
patent: 5585564 (1996-12-01), Brunty et al.
patent: 5593633 (1997-01-01), Dull et al.
patent: 5621414 (1997-04-01), Nakagawa
patent: 5677490 (1997-10-01), Gunther et al.
patent: 5698787 (1997-12-01), Parzuchowski et al.
patent: 5786535 (1998-07-01), Takeuchi et al.
patent: 5902935 (1999-05-01), Georgeson et al.
patent: 5963882 (1999-10-01), Viertl et al.
patent: 5986549 (1999-11-01), Teodorescu
patent: 6057927 (2000-05-01), Levesque et al.
patent: 6167110 (2000-12-01), Possin et al.
patent: 6167760 (2001-01-01), Brunty et al.
patent: 6220099 (2001-04-01), Marti et al.
patent: 6474164 (2002-11-01), Mucciardi et al.
patent: 6484583 (2002-11-01), Chennell et al.
patent: 6507635 (2003-01-01), Birdwell et al.
patent: 6516668 (2003-02-01), Havira et al.
patent: 6641535 (2003-11-01), Buschke et al.
patent: 6658939 (2003-12-01), Georgeson et al.
patent: 6711235 (2004-03-01), Galish et al.
patent: 6722202 (2004-04-01), Kennedy et al.
patent: 6725721 (2004-04-01), Venczel
patent: 6748791 (2004-06-01), Georgeson et al.
patent: 6772635 (2004-08-01), Sale et al.
patent: 6829959 (2004-12-01), Gifford et al.
patent: 6839636 (2005-01-01), Sunshine et al.
patent: 6843130 (2005-01-01), Georgeson
patent: 6843131 (2005-01-01), Graff et al.
patent: 6843312 (2005-01-01), Burk et al.
patent: 6848312 (2005-02-01), Georgeson
patent: 6895079 (2005-05-01), Birdwell et al.
patent: 6927560 (2005-08-01), Pedigo et al.
patent: 6931931 (2005-08-01), Graff et al.
patent: 7050535 (2006-05-01), Georgeson et al.
patent: 7055389 (2006-06-01), Mueller
patent: 7064332 (2006-06-01), Favro et al.
patent: 7228741 (2007-06-01), Georgeson et al.
patent: 7231826 (2007-06-01), Bossi et al.
patent: 7240556 (2007-07-01), Georgeson et al.
patent: 7249512 (2007-07-01), Kennedy et al.
patent: 7253908 (2007-08-01), Vaccaro et al.
patent: 7263889 (2007-09-01), Kennedy et al.
patent: 2004/0237653 (2004-12-01), Graff et al.
patent: 2007/0044563 (2007-03-01), Sarr et al.
patent: 2007/0044564 (2007-03-01), Bui et al.
patent: 28 31 395 (1980-01-01), None
patent: 28 52 560 (1980-01-01), None
patent: 44 31 625 (1994-09-01), None
patent: 198 26 759 (1999-12-01), None
patent: 100 43 199 (2002-09-01), None
patent: 1 193 491 (2002-04-01), None
patent: 62-245153 (1986-04-01), None
patent: 5-346487 (1993-12-01), None
patent: 09 264877 (1997-10-01), None
Maxim CMOS RF/Video Multiplexers, MAX310/311, Maxim Integrated Products, (undated), available at http://pdfserv.maxim-ic.com/en/ds/MAX310-MAX311.pdf (Sep. 24, 2004), 7 pages.
24-Bit Dual-Axis Quadrature Counter, LS7266R1, LSI Computer Systems, Inc., May 2004, available at http://me.in-berlin.de/˜urmel/robot/docu/LS7266R1.pdf (Sep. 24, 2004), 14 pages.
Fast Technologies for Ultrasonic Non Destructive Evaluation—Analog Modules, Oct. 1997, http://www.iai.csic.es/users/end/am.html available Jul. 16, 2004, 3 pages.
MS-8 Multiplexer for Multichannel Ultrasonic Testing, Technical Information, AGFA Krautkramer Ultrasonic Systems, Jun. 2002, 2 pages.
USIP 20 GP The Ultrasonic Systems Instrument for Automated Testing, Krautkrämer, Jun. 1994, 12 pages.
MUX D Multiplexer for Multichannel Ultrasonic Testing, Krautkramer, Jul. 1998, 2 pages.
TTU02-MUX Standalone/Rack, Fractional T1, 2 or 4 Port Multiplexer, available at http://www.megatelindustries.com/ttu02—mux.pdf (Sep. 24, 2004), 2 pages.
Real-time Portable G-Scan System, NDT Solutions Ltd. 2 pages.
MUX 8 Ultrasonic Systems Multiplexer, Ultrasonic Sciences Ltd., Jun. 1998, 2 pages.
High Speed Large Area Scanning Using Air-Coupled Ultrasound, J. O. Strycek et al., http://www.qmi-inc.com/High%20Speed%20Large%20Area%20Scanning%20using%20 . . . available Jul. 12, 2004, 5 pages.
Multi-Channel Multiplexer, GE Inspection Technologies, http://www.geinspectiontechnologies.com/products//Ultrasonics/Multiplexers/index.html available Aug. 30, 2004, 3 pages.
Ultrasonics, GE Inspection Technologies, http://www.geinspectiontechnologies.com/products/Ultrasonics/index.html available Aug. 3, 2004, 1 page.
Ultrasonic Systems and Testing Machines, GE Inspection Technologies, http://www.geinspectiontechnologies.com/solutions/TestingMachines/Ultrasonics/index.h . . . available Aug. 3, 2004, 3 pages.
RapidScan Rapid C-Scanning, NDT Solutions, Ltd., http://www.ndtsolutions.com/rscan.htm available Aug. 5, 2004, 2 pages.
Rapid Scan Specification, NDT Solutions, Ltd., http://www.ndtsolutions.com/spec—rscan.htm, Aug. 5, 2004, 3 pages.
Mechanical Engineering, http://www.fen.bris.ac.uk/faculty/publicity/april04brief/page20.html available Aug. 5, 2004, 2 pages.
Intergrated Ultrasonic Arrays for Rapid Manual Inspection and Mapping, D. Lines, http://www.diagnosticsonar.com/english/industrial/publications/rapidarray.html available Aug. 5, 2004, 17 pages.
Swim, http://www.wavesinsolids.com/intelligent—ultrasonics.htm, available Sep. 24, 2004, 4 pages.
U.S. Appl. No. 10/943,088, filed Sep. 16, 2004; Inventors: Georgeson, entitledMagnetically Attracted Inspecting Apparatus and Method Using a Ball Bearing.
U.S. Appl. No. 10/943,135, filed Sep. 16, 2004, Inventors: Georgeson, entitledMagnetically Attracted Inspecting Apparatus and Method Using a Fluid Bearing.
U.S. Appl. No. 11/041,499, filed Jan. 24, 2005, Inventors: Kennedy, entitledNon-Destructive Stringer Inspection Apparatus and Method.
Stereolithography Made Easy,What is Rapid Prototyping?, available at http://www.stereolithography.com/rapidprototyping.php, May 23, 2005, 11 pages.
GE Inspection Technologies: Array Transducers,Ultrasonic Array Probes, available at http://www.geinspectiontechnologie
Bui Hien T.
Fetzer Barry A.
Krotzer Richard C.
Lee Mark A.
Uyehara Clyde T.
Alston & Bird LLP
Saint-Surin Jacques M.
The Boeing Company
Williams Hezron E.
LandOfFree
Integrated ultrasonic inspection probes, systems, and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Integrated ultrasonic inspection probes, systems, and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated ultrasonic inspection probes, systems, and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4025431