Integrated type probe card and its fabrication method

Details Integrated type probe card and its fabrication method Integrated type probe card and its fabrication method

2006-06-06

2006-06-06

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010

Reexamination Certificate

active

07057406

ABSTRACT:
An integrated type probe card includes a circuit space converter having first and second contacts arranged at different density at two sides, probes connected to the contacts at one side of the circuit space converter that are arranged at a high density probes; a spring connector plate, which holds metal spring members in respective receiving holes thereof, a circuit board pressed on the metal spring members against the contacts at the other side of the circuit space converter that are arranged at a low density, and a level adjustment mechanism that accommodates the probes, the circuit space converter, the spring connector plate and the circuit board and enables the user to adjust the level status of the circuit space converter, keeping the circuit space converter electrically connected to the circuit board for transmitting test signal from the probes to the circuit board.

REFERENCES:
patent: 4027935 (1977-06-01), Byrnes et al.
patent: 4754256 (1988-06-01), Fluhr et al.
patent: 5090118 (1992-02-01), Kwon et al.
patent: 5475318 (1995-12-01), Marcus et al.
patent: 5806181 (1998-09-01), Khandros et al.
patent: 5917707 (1999-06-01), Khandros et al.
patent: 6072190 (2000-06-01), Watanabe et al.
patent: 6615485 (2003-09-01), Eldridge et al.
patent: 2002/0080588 (2002-06-01), Eldridge et al.

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