Integrated thermal characterization and trim of polysilicon...

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics

Reexamination Certificate

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C338S195000

Reexamination Certificate

active

07855432

ABSTRACT:
Devices, systems, and methods for providing an on-chip, temperature-stable resistance network for generating a precision current or precision resistance are disclosed. The resistance network includes a first resistance material having a linear, negative temperature coefficient of resistance and a second resistance material having a linear, positive temperature resistance. The first and second resistance materials are arrayed in segments proximate to a local, pulsed thermal gradient and are combined or mixed, i.e., trimmed, to provide a zero or near zero thermal coefficient.

REFERENCES:
patent: 4210996 (1980-07-01), Amemiya et al.
patent: 5466484 (1995-11-01), Spraggins et al.
patent: 7119656 (2006-10-01), Landsberger et al.
patent: 2003/0006478 (2003-01-01), Clevenger et al.
J.A. Babcock, Member, IEEE, et al., “Precision Electrical Trimming of Very Low TCR Poly-SiGe Resistors”, IEEE Electron Device Letters, vol. 21, No. 6, Jun. 2000, pp. 283-285.

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