Integrated test circuit in an integrated circuit

Details Integrated test circuit in an integrated circuit Integrated test circuit in an integrated circuit

2006-04-25

2006-04-25

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07034559

ABSTRACT:
The invention relates to an integrated test circuit in an integrated circuit for testing a plurality of internal voltages. A switching device is provided to select one of the internal voltages in accordance with a selection signal for the purpose of testing, and a comparator device is provided in order to compare a measurement voltage, dependent on the selected internal voltage, with an externally provided reference voltage. An error signal is output as a result of the comparison.

REFERENCES:
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patent: 4931722 (1990-06-01), Stoica
patent: 5030904 (1991-07-01), Tanksalvala et al.
patent: 5418470 (1995-05-01), Dagostino et al.
patent: 5642057 (1997-06-01), Oke et al.
patent: 100 63 102 (2001-08-01), None
patent: 101 10 626 (2002-10-01), None

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