Integrated test circuit for display devices such as LCD's

Details Integrated test circuit for display devices such as LCD's Integrated test circuit for display devices such as LCD's

1991-02-28

1992-05-12

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 340765, 340653, G01R 3128, G01R 3102

Patent

active

051131340

ABSTRACT:
A circuit for testing a liquid crystal display for open data lines, for identifying select lines shorted to data lines, and for identifying failed data line scanner stages includes thin film transistors arranged between each data line and a segmented bus. A sectioned shift register sequentially actuates the thin film transistors and the bus segments are monitored while data signals are applied to the data lines. The absence of a voltage on the bus indicates an open data line. The bus is also monitored while select signals are applied to the select lines and the shift register sequentially actuates the thin film transistors, the presence of a voltage on the bus indicates a short between a data line and a select line.

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patent: 4899105 (1990-02-01), Akiyama
patent: 5057775 (1991-10-01), Hall

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