Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Patent
1998-04-29
2000-02-01
Gutierrez, Diego
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
327512, G01K 701
Patent
active
060195088
ABSTRACT:
An integrated temperature sensor circuit (9) comprises two different current sources (14 and 15) multiplexed using switches (12 and 13) controlled by Clocks 1 and 2 having opposite phases into a bipolar transistor 11. V.sub.be is developed on capacitor (23) during the first clock phase and .DELTA.V.sub.be is developed on capacitor (23) during the second clock phase. A second capacitor (27) is coupled between the input and output of an operational amplifier (25). The second capacitor (27) is discharged during the first clock phase and is charged during the second clock phase. Since .DELTA.V.sub.be is dependent on temperature, the voltage at the output of the operational amplifier (25) is dependent on the temperature and the ratio of the two capacitors.
REFERENCES:
patent: 3812717 (1974-05-01), Miller et al.
patent: 5195827 (1993-03-01), Audi et al.
patent: 5546041 (1996-08-01), Szajda
"Micropower CMOS Temperature Sensor with Digital Output", Bakker et al., IEEE Journal of Solid-State Circuits. vol. 31, No. 7, Jul. 1996, pp. 933-937, 0018-9200(96)04470-8.
"A Low Noise, High Resolution Silicon Temperature Sensor", Szajda et al., IEEE Journal of Solid-State Circuits, vol. 31, No. 9, Sep. 1996, pp. 1308-1313, 0018-9200(96)06473-6.
Dover Rennie W.
Gutierrez Diego
Motorola Inc.
Verbitsky Gail
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