Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-08-07
2007-08-07
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
11243661
ABSTRACT:
A system on chip (SOC), comprises an external interface that receives test configuration data, transmits test result data, and that transmits and receives application data. A plurality of SOC components, each including an integrated system test (IST) module, wherein at least one of the SOC components includes a controller that communicates with the external interface. At least one of the plurality of SOC components communicates with the controller. At least one of the IST modules is a master IST module that receives the test configuration data and configures the IST modules for testing the plurality of SOC components.
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Azimi Saeed
Ho Son
Marvell International Ltd.
Nguyen Ha Tran
Nguyen Tung X.
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