Integrated systems testing

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

active

11243661

ABSTRACT:
A system on chip (SOC), comprises an external interface that receives test configuration data, transmits test result data, and that transmits and receives application data. A plurality of SOC components, each including an integrated system test (IST) module, wherein at least one of the SOC components includes a controller that communicates with the external interface. At least one of the plurality of SOC components communicates with the controller. At least one of the IST modules is a master IST module that receives the test configuration data and configures the IST modules for testing the plurality of SOC components.

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patent: 6775091 (2004-08-01), Sutardja
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patent: 7069376 (2006-06-01), Mathewson et al.
patent: 2005/0174678 (2005-08-01), Zayas et al.
patent: 2005/0289262 (2005-12-01), Sutardja
patent: 2006/0119963 (2006-06-01), Hidaka

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