Integrated sub-nanometer-scale electron beam systems

Details Integrated sub-nanometer-scale electron beam systems Integrated sub-nanometer-scale electron beam systems

2007-10-09

2007-10-09

Vanore, David A. (Department: 2881)

Radiant energy

With charged particle beam deflection or focussing

Magnetic lens

C250S318000, C250S36100C, C445S024000

Reexamination Certificate

active

10983566

ABSTRACT:
A solid state sub-nanometer-scale electron beam emitter comprising a multi-layered structure having a nano-tip electron emitter and tunnel emission junction formed on substrate, an initial electron beam extraction electrode, a “nano-sandwich Einzel” electrode, and a topmost protective layer.

REFERENCES:
patent: 3780334 (1973-12-01), Leboutet
patent: 4680467 (1987-07-01), Bryson, III et al.
patent: 4939363 (1990-07-01), Bando et al.
patent: 5122663 (1992-06-01), Chang et al.
patent: 5233205 (1993-08-01), Usagawa et al.
patent: 5247223 (1993-09-01), Mori et al.
patent: 5393647 (1995-02-01), Neukermans et al.
patent: 5587586 (1996-12-01), Kruit
patent: 5633502 (1997-05-01), Fischione
patent: 5654548 (1997-08-01), Fink et al.
patent: 5940678 (1999-08-01), Doong et al.
patent: 5986264 (1999-11-01), Grunewald
patent: 6005247 (1999-12-01), Baum
patent: 6020677 (2000-02-01), BlanchetFincher et al.
patent: 6023060 (2000-02-01), Chang et al.
patent: 6043491 (2000-03-01), Ose et al.
patent: 6060839 (2000-05-01), Sverdrup, Jr. et al.
patent: 6100639 (2000-08-01), Sverdrup, Jr. et al.
patent: 6140652 (2000-10-01), Shlepr et al.
patent: 6159742 (2000-12-01), Lieber et al.
patent: 6188068 (2001-02-01), Shaapur et al.
patent: 6194720 (2001-02-01), Li et al.
patent: 6195214 (2001-02-01), Muray et al.
patent: 6214651 (2001-04-01), Cox
patent: 6300631 (2001-10-01), Shofner
patent: 6369385 (2002-04-01), Muray et al.
patent: 6417060 (2002-07-01), Tavkhelidze et al.
patent: 6680214 (2004-01-01), Tavkhelidze et al.
patent: 6771012 (2004-08-01), Ahmed et al.
patent: 2005/0084980 (2005-04-01), Koo et al.

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