Semiconductor device manufacturing: process – Making passive device – Stacked capacitor
Reexamination Certificate
2007-04-26
2010-06-15
Prenty, Mark (Department: 2822)
Semiconductor device manufacturing: process
Making passive device
Stacked capacitor
C257SE21008
Reexamination Certificate
active
07736986
ABSTRACT:
An integrated stacked capacitor comprises a first capacitor film (46) of polycrystalline silicide, a second capacitor film (48) and a first dielectric (26) sandwiched between the first capacitor film (46) and second capacitor film (48). A second dielectric (34) and a third capacitor film (50) are provided. The second dielectric (34) is sandwiched between the second capacitor film (48) and third capacitor film (50). A method for fabrication of an integrated stacked capacitor comprises the following sequence of steps: applying a polysilicide layer (20) to form the first capacitor film (46); applying a first dielectric (26); applying a first metallization layer (28) to form the second capacitor film (48); applying a second dielectric (34); and applying a second metallization layer (44) to form the third capacitor film (50).
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Arzubi et al., IBM Technical Disclosure Bulletin, vol. 17, No. 6, Nov. 1974, pp. 1569-1570.
Babcock Jeffrey
Balster Scott
Dirnecker Christoph
Brady III Wade J.
Garner Jacqueline J.
Prenty Mark
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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