Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Analysis of complex waves
Reexamination Certificate
2006-10-03
2006-10-03
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Analysis of complex waves
C324S076230
Reexamination Certificate
active
07116092
ABSTRACT:
Spectrum analyzer circuits and methods are provided which implement “zero-IF” (direct conversion) or “near-zero IF” (or very low IF) architectures that enable implementation of integrated (on-chip) spectrum analyzers for measuring the frequency spectrum of internal chip signals. An integrated spectrum analyzer circuit, which includes a zero IF or near-zero IF framework, enables a low-power compact design with sufficient resolution bandwidth for on-chip implementation and diagnostics of internal chip signals.
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Jenkins Keith Aelwyn
Jose Anup Paul
Reynolds Scott Kevin
Deb Anjan
DeRosa Frank V.
F. Chau & Associates LLC
Nguyen Hoai-An D.
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