Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate
2007-11-06
2007-11-06
Connolly, Patrick (Department: 2877)
Optics: measuring and testing
By light interference
Spectroscopy
C356S480000
Reexamination Certificate
active
11380684
ABSTRACT:
Integrated spectroscopy systems are disclosed. In some examples, integrated tunable detectors, using one or multiple Fabry-Perot tunable filters, are provided. Other examples use integrated tunable sources. The tunable source combines one or multiple diodes, such as superluminescent light emitting diodes (SLED), and a Fabry Perot tunable filter or etalon. The advantages associated with the use of the tunable etalon are that it can be small, relatively low power consumption device. For example, newer microelectrical mechanical system (MEMS) implementations of these devices make them the size of a chip. This increases their robustness and also their performance. In some examples, an isolator, amplifier, and/or reference system is further provided integrated.
REFERENCES:
patent: 5475221 (1995-12-01), Wang
patent: 5646729 (1997-07-01), Koskinen et al.
patent: 5818586 (1998-10-01), Lehto et al.
patent: 6204920 (2001-03-01), Ellerbrock et al.
patent: 6381022 (2002-04-01), Zavracky
patent: 6407376 (2002-06-01), Korn et al.
patent: 6619864 (2003-09-01), Johnson et al.
patent: 6639666 (2003-10-01), Li
patent: 6905255 (2005-06-01), Flanders et al.
patent: 41 22 925 (1993-01-01), None
patent: 0 709 659 (1996-01-01), None
Brochure, “Agilent 83437A Broadband Light Source and Agilent 83438A Erbium ASE Source, Production Overview,” Agilent Technologies, 1996, 2002.
Vakhshoori, D. et al., “Raman Amplification Using High-Power Incoherent Semiconductor Pump Sources,” Ahara Corporation, MA, 2003.
Krawczyk, S. K. et al., “GaN and Related Compunds for MEMS and MOEMS,” Aromagraph DC 2000 System, vol. 51, No. 8, 1999, pp. 623-625.
Atia Walid A.
Flanders Dale C.
Kotidis Petros
Kuznetsov Mark E.
Axsun Technologies, Inc.
Connolly Patrick
Houston Eliseeva LLP
LandOfFree
Integrated spectroscopy system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Integrated spectroscopy system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated spectroscopy system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3835354