Integrated sensor and circuitry and process therefor

Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Having enclosed cavity

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S686000, C257SE23042

Reexamination Certificate

active

07732302

ABSTRACT:
A micromachined sensor and a process for fabrication and vertical integration of a sensor and circuitry at wafer-level. The process entails processing a first wafer to incompletely define a sensing structure in a first surface thereof, processing a second wafer to define circuitry on a surface thereof, bonding the first and second wafers together, and then etching the first wafer to complete the sensing structure, including the release of a member relative to the second wafer. The first wafer is preferably a silicon-on-insulator (SOI) wafer, and the sensing structure preferably includes a member containing conductive and insulator layers of the SOI wafer. Sets of capacitively coupled elements are preferably formed from a first of the conductive layers to define a symmetric capacitive full-bridge structure.

REFERENCES:
patent: 5345824 (1994-09-01), Sherman et al.
patent: 5610335 (1997-03-01), Shaw et al.
patent: 6277666 (2001-08-01), Hays et al.
patent: 6313529 (2001-11-01), Yoshihara et al.
patent: 6701788 (2004-03-01), Babala
patent: 6718605 (2004-04-01), Yazdi et al.
patent: 6846724 (2005-01-01), Harris et al.
patent: 2004/0065638 (2004-04-01), Gogoi
patent: 2006/0201249 (2006-09-01), Horning et al.
patent: 2008/0138922 (2008-06-01), Wan
Frank Niklaus, Sjoerd Haasl, and Goran Stemme; “Arrays of Monocrystalline Silicon Micromirrors Fabricated Using CMOS Compatible Transfer Bonding”; Journal of Microelectromechanical Systems, vol. 12, No. 4, Aug. 2003, pp. 465-469.
Navid Yazdi, Haluk Kulah, and Khalil Najafi; “Precision Readout Circuits for Capacitive Microaccelerometers”; Center of Wireless Integrated Microsystems, IEEE 2004.
Kei Ishihara, Chi-Fan Yung, Arturo A. Ayon and Martin A. Schmidt; “An Inertial Sensor Technology Using DRIE and Wafer Bonding with Interconnecting Capability”; Journal of Microelectromechanical Systems, vol. 8, No. 4, Dec. 1999, pp. 403-407.
Mark Lemkin and Bernhard E. Boser; “A Three-Axis Micromachined Accelerometer with a CMOS Position-Sense Interface and Digital Offset-Trim Electronics”; IEEE Journal of Solid-State Circuits, vol. 34, No. 4, Apr. 1999, pp. 456-467.
Michel Diespont, Ute Drechsler, R. Yu, H.B. Pogge and P. Vittiger; “Wafer-Scale Microdevice Transfer/ Interconnect: Its Application in an AFM-Based Data-Storage System”; Journal of Microelectromechanical Systems, vol. 13, No. 6, Dec. 2004, pp. 895-901.
Navid Yazdi and Khalil Najafi; “An Interface IC for a Capacitive Silicon ug Accelerometer”; 1999 IEEE International Solid-State Circuits Conference; Session 7; Paper TA 7.2.
J. Kijhamaki, H. Ronkainen, P. Pekko, H. Kattelus and K. THEQVIST; “Modular Integration of CMOS and SOI-MEMS Using “Plug-Up” Concept”; 12th International Conference on Solid State Sensors, Actuators and Microsystems, Boston, Jun. 8-12, 2003.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Integrated sensor and circuitry and process therefor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated sensor and circuitry and process therefor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated sensor and circuitry and process therefor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4223995

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.