Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2006-06-06
2006-06-06
Ho, Tu-Tu (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257SE45002, C257S002000, C257S004000
Reexamination Certificate
active
07057201
ABSTRACT:
An integrated semiconductor memory (1) has a multiplicity of memory cells (Z) and first lines (10) and second lines (20) that can be used to actuate the memory cells (Z). The path of each of the first lines (10) contains a respective device (5) that permits actuation of memory cells exclusively in the region of first subsections (I) of the first lines (10). The devices (5) can be set such that they bring about only partial decoupling of the second subsections (II) of the first lines (10) from the slatter's first subsections (I), with memory cells either in the region of the first subsections (I) only or in the region of both subsections (I, II) being able to be actuated, depending on the choice of a relatively short or a relatively long access time to the memory cells. This allows subregions of the semiconductor memory to be used for power-saving and faster memory operation.
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Spall, E., Presentation to IEEE Electron Device Society, IEEE Electron Devices Meeting, Manassas, May 22, 2001.
Ho Tu-Tu
Infineon - Technologies AG
Slater & Matsil L.L.P.
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