Integrated semiconductor circuit for thermal measurements

Details Integrated semiconductor circuit for thermal measurements Integrated semiconductor circuit for thermal measurements

1990-06-22

1991-11-12

Levy, Stuart S.

Thermal measuring and testing

Temperature measurement

By electrical or magnetic heat sensor

374170, 374173, 7320411, 7320415, G01K 700, G01K 1704, G01F 168

Patent

active

050642960

ABSTRACT:
Integrated semiconductor circuit for thermal measurements, comprising at least a thermal signal comparator (8), the comparator (8) being provided with a signal feedback loop containing a DA signal converter (3), more specifically, the comparator (8) being a temperature or a heat current comparator, the DA signal-converter (3) comprising a thermal output and the signal feedback loop comprising components for the transfer of thermal signals.

REFERENCES:
patent: 4008617 (1977-02-01), Yen et al.
patent: 4045658 (1977-08-01), Peltola
patent: 4186384 (1980-01-01), Acker
patent: 4373386 (1983-02-01), Huijsing
patent: 4439756 (1984-03-01), Shenoi et al.
patent: 4651564 (1987-03-01), Honeywell
patent: 4672361 (1987-06-01), Kokubo
patent: 4693116 (1987-09-01), Soken
patent: 4782708 (1988-11-01), Harrington
patent: 4866442 (1989-09-01), Steim et al.
patent: 4890489 (1990-01-01), Bronkhorst
Electronics Letters, vol. 24, No. 9, 28th Apr. 1988; pp. 542-543.

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