Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-02-06
2007-02-06
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090
Reexamination Certificate
active
10912331
ABSTRACT:
An integrated printed circuit board and test contactor for high speed semiconductor testing having an alignment housing with a cavity for receipt and positioning of the integrated circuit to be tested, a printed circuit board having a non-conductive elastomer portion positioned along a surface of the printed circuit board and an electrically balanced microwave transmission line structure having flexible fingers for transmitting test signals from the integrated circuit through the printed circuit board. A U-shaped ground element extends around the microwave transmission line structure.
REFERENCES:
patent: 4597617 (1986-07-01), Enochs
patent: 4697143 (1987-09-01), Lockwood et al.
patent: 4829242 (1989-05-01), Carey et al.
patent: 4894612 (1990-01-01), Drake et al.
patent: 4912399 (1990-03-01), Greub et al.
patent: 5012187 (1991-04-01), Littlebury
patent: 5038100 (1991-08-01), Kushner et al.
patent: 5069629 (1991-12-01), Johnson
patent: 5123850 (1992-06-01), Elder et al.
patent: 5207584 (1993-05-01), Johnson
patent: 5268636 (1993-12-01), Phillips et al.
patent: 5330919 (1994-07-01), Westbrook et al.
patent: 5360348 (1994-11-01), Johnson
patent: 5426405 (1995-06-01), Miller et al.
patent: 5561378 (1996-10-01), Bockelman et al.
patent: 5688128 (1997-11-01), Ikeya
patent: 5914613 (1999-06-01), Gleason et al.
patent: 6025731 (2000-02-01), Hembree et al.
patent: 6064218 (2000-05-01), Godfrey et al.
patent: 6437584 (2002-08-01), Gleason et al.
patent: 6815963 (2004-11-01), Gleason et al.
patent: 6838890 (2005-01-01), Tervo et al.
patent: 7057404 (2006-06-01), Gleason et al.
patent: 44 17 586 (1995-02-01), None
patent: 2005070050 (2005-03-01), None
patent: WO 00/04394 (2000-01-01), None
Leslie, Brian et al, Hewlett Packard Co., Circuity Technology R&D Laboratories, P.O. Box 10490, Palo Alto, CA 94303, Membrane Probe Card Technology (The Future For High Performance Wafer Test), 1988 (Month Unavailable), IEEE 1988 International Test Conference, Paper 30.1, pp. 601-607.
Berg, W. E. “Multi-GHz Elastomeric Connectors for Complex Hybrids and Chip Carriers.” IEEE, May 22, 1989, pp. 50-70.
Communication from the EPO dated Dec. 12, 2004 enclosing 1) European Search Report, Application No. 04 25 5058, Search Completed on Nov. 23, 2004, Berlin; and 2) Abstract (4 pages).
Communication from the Austrian Patent Office Service and Information Center (TRF) dated Mar. 18, 2005; Search Report, completed on Mar. 3, 2005, Austria.
Mroczkowski Jason
Treibergs Valts
Christie Parker & Hale, LLP.
Delaware Capital Formation Inc.
Karlsen Ernest
LandOfFree
Integrated printed circuit board and test contactor for high... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Integrated printed circuit board and test contactor for high..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated printed circuit board and test contactor for high... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3835626