Integrated photosensor using test capacitor to test functioning

Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit

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250214R, 3241581, 324 731, H01L 2714, H01L 3118

Patent

active

060375787

ABSTRACT:
Photosensor comprising a network (R) of cells ( . . . , Cn-1, Cn, Cn+1, Cn+2, . . . ) each comprising a photosensitive component (PH) and an exploitation circuit (CE) for allowing the transfer of a measurement signal coming from the cell ( . . . , Cn-1, Cn, Cn+1, Cn+2, . . . ) and due to the illumination of this cell, to a common output (SC) of the photosensor. An addressing signal allows to sequentially connect all the cells to said common output. According to the invention, each cell also comprises an integrated conductive region (RC) forming together with said photosensitive component (PH) a test capacitor (CPT) which is coupled to the parasite capacitor (CP). In view of testing said photosensitive components (PH) in the dark, it also comprises means (H, CT, M) integrated on the chip (P) for applying, in synchronism with the selective applying of said addressing signal, to said test capacitor (CPT) a test pulse provoking a transfer of charge from said test capacitor (CPT) towards the parasite capacitor (CP). This simulates the illumination of the diode, and generates on the common output (SC), instead of said measurement signal, a signal representative of the functioning of the cell thus addressed.

REFERENCES:
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Arreguit, Xavier F., Et Al "A CMOS Motion Detector System for Pointing Devices" I.E.E.E. Journal of Solid-State Circuits, vol. 31, No. 12, Dec. 1996 (pp. 1916-1921).

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