Integrated optical waveguide fabrication by ion implantation

Coating processes – Electrical product produced – Integrated circuit – printed circuit – or circuit board

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427163, B05D 306

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active

045214433

ABSTRACT:
A method for fabricating optical waveguides and other optical devices. Nitrogen ions are implanted by ion bombardment in a substrate composed of silicon dioxide. Damage to the atomic structure caused by the bombardment is removed by annealing to obtain a low-loss device. The chemical interaction of the nitrogen ions with the silicon dioxide creates an implanted region having an increased index of refraction, which implanted region retains the increased refractive index after annealing.

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Standley et al., "Properties of Ion-Bombarded Fused Quartz for Integrated Optice", Applied Optics, vol. II, pp. 1313-1316, (Jun. 1972).
Webb et al., "Refractive Index Profiles Induced by Ion Implantation Into Silica", J. Phys. D.: Applied Physics, vol. 9, pp. 1343-1354, (1976).

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