Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1989-06-27
1990-11-13
Willis, Davis L.
Optics: measuring and testing
By particle light scattering
With photocell detection
350 9613, 350 9614, G01B 902
Patent
active
049697420
ABSTRACT:
A wavemeter fabricated using integrated optics technology. A waveguide structure is formed in a substrate, the structure including signal and reference waveguides and means for coupling an optical input signal into both waveguides. Means are provided for varying the optical path length of the signal waveguide with respect to the reference waveguide in response to a control signal. Optical signals passing through the waveguides are coupled to a detection system that produces a feedback signal having a characteristic that is a function of the optical path length difference between the waveguides, and of the wavelength of the optical input signal. A control system receives the feedback signal and produces the control signal such that the feedback signal characteristic is driven towards a predetermined value. The control signal then provides a measure of the wavelength of the optical input signal.
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Falk R. Aaron
Laybourn Loren E.
Koren Matthew W.
The Boeing Company
Willis Davis L.
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