Integrated metallic contact probe storage device

Details Integrated metallic contact probe storage device Integrated metallic contact probe storage device

2004-07-02

2009-06-02

Luu, Chuong A. (Department: 2892)

Semiconductor device manufacturing: process

Packaging or treatment of packaged semiconductor

Incorporating resilient component

C438S052000, C438S054000

Reexamination Certificate

active

07541219

ABSTRACT:
A mass storage device includes a probe that has a cantilever having a first end region operatively connected to a substrate and a second end region rotated in a direction such that the second end region is opposed to the first end region. A tip is disposed on the second end region, with the tip pointing in a direction opposed to the first end region.

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