Image analysis – Applications – Manufacturing or product inspection
Patent
1995-08-14
1998-09-22
Kelley, Christopher S.
Image analysis
Applications
Manufacturing or product inspection
382147, 382146, 348 87, 348129, G06K 900
Patent
active
058126937
ABSTRACT:
An integrated machine vision inspection and rework system is provided for inspecting and reworking printed circuit boards. The system includes an inspection unit that acquires image data of printed circuit boards mounted on a machine framework and a vision computer that processes the image data contained within a chamber in the framework. Also mounted on the framework is a three stage asynchronous conveyor with sensors, and drive and stepping motors that communicate with I/O boards connected to the vision computer. A rework station also mounted on the framework provides a dual reporting scheme, which includes both a laser indicator and a fault display monitor.
REFERENCES:
patent: 4914513 (1990-04-01), Spigarelli et al.
patent: 5237622 (1993-08-01), Howell
patent: 5272761 (1993-12-01), Kanai et al.
patent: 5537331 (1996-07-01), Shinonaga
Burt Robert G.
Kalnajs Andrejs K.
Chrysler Corporation
Kelley Christopher S.
Stec Jennifer M.
LandOfFree
Integrated machine vision inspection and rework system -- CIP does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Integrated machine vision inspection and rework system -- CIP, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated machine vision inspection and rework system -- CIP will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1631530