Integrated logic circuit adapted to performance tests

Details Integrated logic circuit adapted to performance tests Integrated logic circuit adapted to performance tests

1983-10-27

1985-08-20

Miller, Stanley D.

Electrical pulse counters, pulse dividers, or shift registers: c

Shift register

Particular input circuit

377 72, 377 81, G11C 1900

Patent

active

045368813

ABSTRACT:
An easily testable integrated logic circuit utilizes a plurality of flip-flops to form a feedback shift register. In some embodiments, means are provided for selectively forming the flip-flops into a feedback shift register and for selectively supplying either the flip-flop contents or a random signal as partial inputs to the combinational logic circuit. In other embodiments, the feedback shift register is coupled to the AND logic array outputs of a combinational circuit which also includes and OR logic array.

REFERENCES:
patent: 3258696 (1966-06-01), Heymann
patent: 3535642 (1970-10-01), Webb
patent: 3651315 (1972-03-01), Collins
patent: 3911330 (1975-10-01), Fletcher et al.
patent: 3924144 (1975-12-01), Hadamard
patent: 3958110 (1976-05-01), Hong et al.
patent: 4139318 (1979-02-01), Schneider
patent: 4213007 (1980-07-01), Funk

Affiliated with

Also associated with

Rating

Integrated logic circuit adapted to performance tests does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated logic circuit adapted to performance tests, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated logic circuit adapted to performance tests will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-564557