Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-01-11
2011-01-11
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07868630
ABSTRACT:
A probe card is disclosed which includes a body, at least one housing in the body, the housing having at least one light opening, and at least one light conditioning device in the at least one light opening in the housing. A method of forming a probe card is also disclosed which includes forming an opening in a body of the probe card, positioning a housing having a light opening in the opening in the body of the probe card and positioning at least one light conditioning device in the light opening in the housing.
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Caldwell John
Cleverly Randy
Dickstein & Shapiro LLP
Micro)n Technology, Inc.
Nguyen Ha Tran T
Vazquez Arleen M
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