Integrated laser imaging and spectral analysis system

Details Integrated laser imaging and spectral analysis system Integrated laser imaging and spectral analysis system

1998-11-13

2000-05-30

Evans, F. L.

Optics: measuring and testing

For optical fiber or waveguide inspection

356301, 3562373, 3562374, G01J 344, G01N 2165, G01N 2188

Patent

active

060696907

ABSTRACT:
A system for analyzing an object has two operating modes such as scanned imaging mode and stop scan spectral analysis mode. A beam scanner is optically connected to a laser to receive laser beams from the laser. Beam scanner also scans the beams if the system is in the scanned imaging mode. A lens (e.g., an objective lens) is optically coupled to the beam scanner to focus the beams received from the beam scanner. A sensor is optically coupled to the lens to receive the beams that reflect from the object. The sensor may detect characteristics of the beam such as color and intensity. A spectrometer is optically coupled to the objective lens. During stop scan spectral analysis mode, spectrometer generates wavelength spectrum data.

REFERENCES:
patent: 5329352 (1994-07-01), Jacobsen
patent: 5479252 (1995-12-01), Worster et al.
Product Specification entitled "Labram Contents", EG&G Instruments, Jun. 1994, 51 pages.
Preliminary User's Manual entitled "Laser Imaging System With Micro-Raman/PL", Ultrapointe Corporation, 1998, 7 pages.
Product Brochure entitled Raman Imaging Microscope, Renishaw plc, , Transducer Systems, Division, Gloucestershire UK, 1992, 5 pages.

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