Thermal measuring and testing – Temperature measurement – Composite temperature-related paramenter
Patent
1997-06-27
1999-05-11
Gutierrez, Diego
Thermal measuring and testing
Temperature measurement
Composite temperature-related paramenter
374137, 374166, G01K3/14;7/00
Patent
active
059020440
ABSTRACT:
A matrix of thermal sensors is provided for accurately evaluating the thermal characteristics of an integrated circuit. The integrated circuit is evenly divided into a plurality of sectors in which a thermal comparison to a known thermal mass will be performed. Each sector includes at least one dual cell comprising a local thermal sensor for providing an output corresponding to a local temperature of the integrated circuit in that sector, and a background thermal sensor. The outputs of selective ones of the background thermal sensors are combined to provide a signal corresponding to a background temperature of the integrated circuit. A decoder/enabler arrangement is used to selectively gate the output of a specific local thermal sensor in a sector to a difference circuit where it is compared to the collective output of selected ones of the background sensors to generate a thermal measurement of the sector under test.
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Goodnow Kenneth Joseph
Michail Michel S.
Patel Janak Ghanshyambhai
Pricer Wilbur
Ventrone Sebastian T.
Chadurjian Mark F.
Doan Quyen
Gutierrez Diego
International Business Machines - Corporation
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