Integrated EWP-STM spin resonance microscope

Details Integrated EWP-STM spin resonance microscope Integrated EWP-STM spin resonance microscope

2006-09-19

2006-09-19

Arana, Louis M. (Department: 2859)

Electricity: measuring and testing

Particle precession resonance

C324S304000, C324S316000

Reexamination Certificate

active

07109706

ABSTRACT:
A novel spin resonance microscope is disclosed, the microscope design comprising an integrated evanescent wave probe and scanning tunneling microscope tip. The probe and tip may be either the same structure, or they may be separate structures. The integrated design allows for coherent excitation of precessing electron spin states in the sample such that spin resonance may be detected because the tunneling current is modulated by the spin resonance. Spin resonance may be affected by either adjacent nuclei, or by adjacent electrons. The present apparatus requires significantly reduced power inputs, such that the dead time of the system is short, and relaxation phenomena may be evaluated without swamping the instrument's electronics.

REFERENCES:
patent: 5489774 (1996-02-01), Akamine et al.
patent: 5585722 (1996-12-01), Hosoki et al.
patent: 5619139 (1997-04-01), Holczer et al.
patent: 6211532 (2001-04-01), Yagi
patent: 6946835 (2005-09-01), Xiang et al.

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