Integrated electronic disconnecting circuits, methods, and...

Details Integrated electronic disconnecting circuits, methods, and... Integrated electronic disconnecting circuits, methods, and...

2007-08-28

2007-08-28

Jackson, Stephen W. (Department: 2836)

Electricity: electrical systems and devices

Safety and protection of systems and devices

With specific voltage responsive fault sensor

Reexamination Certificate

active

10924763

ABSTRACT:
Merged devices for transient blocking. A pass transistor is placed so that its body potential drives the gate of a depletion-mode JFET-type blocking transistor. Thus a transient which appears on an external terminal is very rapidly propagated to shut off the blocking transistor, before large numbers of carriers can be injected. Preferably a shunt device is also used to drop high potentials which may appear at the same time. This connection can be particularly useful in power or data input terminals.

REFERENCES:
patent: 4366495 (1982-12-01), Goodman et al.
patent: 4514747 (1985-04-01), Miyata et al.
patent: 4533970 (1985-08-01), Brown
patent: 5130262 (1992-07-01), Masquelier et al.
patent: 5168175 (1992-12-01), Endo
patent: 5742463 (1998-04-01), Harris
patent: 6020608 (2000-02-01), Kamashita
patent: 6040971 (2000-03-01), Martenson et al.
patent: 6266223 (2001-07-01), Curry
patent: 6459108 (2002-10-01), Bartsch et al.
patent: 6515330 (2003-02-01), Hurtz et al.
patent: 94/00358 (1995-01-01), None

Affiliated with

Also associated with

Rating

Integrated electronic disconnecting circuits, methods, and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated electronic disconnecting circuits, methods, and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated electronic disconnecting circuits, methods, and... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3898227