Optics: measuring and testing – By polarized light examination
Patent
1993-01-22
1995-08-01
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
250225, 257 98, G01J 400
Patent
active
054384141
ABSTRACT:
The invention is directed to an integrated dual imaging detector on a single silicon chip comprising a beam interleaving polarization analyzer bonded to a charge-coupled device, serial shift register and associated image transfer circuitry, analog signal processors, and analog-to-digital converters. The invention permits the simultaneous acquisition and processing of two polarization images of rapidly changing subjects.
REFERENCES:
patent: 4709144 (1987-11-01), Vincent
patent: 5102222 (1992-04-01), Berger et al.
patent: 5125743 (1992-06-01), Rust et al.
D. M. Rust, A Search for Polarization in Ellerman Bombs, Solar Phys. 140, 55-65 (Feb. 1992).
Cooch Francis A.
Pham Hoa Q.
The Johns Hopkins University
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