Integrated CMOS spectrum analyzer for on-chip diagnostics...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Analysis of complex waves

Reexamination Certificate

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C324S076220

Reexamination Certificate

active

11485390

ABSTRACT:
An integrated spectrum analyzer for performing on-chip power spectrum measurements, includes a digital autocorrelator that includes an analog input for inputting analog signal samples from a chip, an analog-to-digital converter for converting the analog signal samples into digital signal samples, a storage register for storing a first converted digital signal sample for a period of time, a digital multiplier for multiplying the first stored digital signal after the period of time with a second undelayed digital signal sample to produce a product of multiplication, and an accumulator for accumulating a plurality of products of multiplication for each new period of time. The digital autocorrelator computes an autocorrelation function based on the analog signal samples and is integrally formed on the chip for performing power spectrum measurements on the analog signal samples to compute the autocorrelation function.

REFERENCES:
patent: 5565764 (1996-10-01), Priebe et al.
patent: 5949798 (1999-09-01), Sakaguchi
patent: 6292760 (2001-09-01), Burns
patent: 7116092 (2006-10-01), Jenkins et al.

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