Integrated circuits with temperature-change and...

Details Integrated circuits with temperature-change and... Integrated circuits with temperature-change and...

2005-08-23

2005-08-23

Young, Brian (Department: 2819)

Coded data generation or conversion

Converter calibration or testing

C341S144000

Reexamination Certificate

active

06933869

ABSTRACT:
Integrated circuits are stabilized by monitoring changes that affect circuit operation and by compensating for those changes using power supply adjustments. Changes in operating temperature and threshold voltage changes may be measured. Differential measurements may be made in which threshold voltages measured in continuously-biased monitoring circuits are compared to threshold voltages measured in intermittently-biased monitoring circuits. Temperature changes may be monitored using a temperature monitoring circuit based on an adjustable current source and a diode. Monitoring and compensation circuitry on the integrated circuits may use analog-to-digital and digital-to-analog converters controlled by a control unit to make temperature and threshold voltage measurements and corresponding compensating changes in power supply voltages.

REFERENCES:
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patent: 6195295 (2001-02-01), McPartland
patent: 6462986 (2002-10-01), Khan
John G. Maneatis “Low-Jitter Process-Independent DLL and PLL Based on Self-Biased Techniques”, IEEE Journal of Solid-State Circuits, vol. 31, No. 11 (Nov. 1996) pp. 1723-1732.
Paul R. Gray et al. “Analysis and Design of Analog Integrated Circuits”, John Wiley & Sons, Inc. 1993, p. 329, no month.

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