Integrated circuits protected against reverse engineering...

Details Integrated circuits protected against reverse engineering... Integrated circuits protected against reverse engineering...

2007-11-13

2007-11-13

Jackson, Jerome (Department: 2815)

Active solid-state devices (e.g., transistors, solid-state diode

Combined with electrical contact or lead

Of specified configuration

C257S355000, C257S357000, C257S382000, C257S383000, C257S384000, C257S048000

Reexamination Certificate

active

09768904

ABSTRACT:
Semiconducting devices, including integrated circuits, protected from reverse engineering comprising metal traces leading to field oxide. Metallization usually leads to the gate, source or drain areas of the circuit, but not to the insulating field oxide, thus misleading a reverse engineer. A method for fabricating such devices.

REFERENCES:
patent: 3673471 (1972-06-01), Klein et al.
patent: 3946426 (1976-03-01), Sanders
patent: 4017888 (1977-04-01), Christie et al.
patent: 4139864 (1979-02-01), Schulman
patent: 4164461 (1979-08-01), Schilling
patent: 4196443 (1980-04-01), Dingwall
patent: 4267578 (1981-05-01), Vetter
patent: 4291391 (1981-09-01), Chatterjee et al.
patent: 4295897 (1981-10-01), Tubbs et al.
patent: 4314268 (1982-02-01), Yoshioka et al.
patent: 4317273 (1982-03-01), Guterman et al.
patent: 4322736 (1982-03-01), Sasaki et al.
patent: 4374454 (1983-02-01), Jochems
patent: 4409434 (1983-10-01), Basset et al.
patent: 4435895 (1984-03-01), Parillo
patent: 4471376 (1984-09-01), Morcom et al.
patent: 4581628 (1986-04-01), Miyauchi et al.
patent: 4583011 (1986-04-01), Pechar
patent: 4603381 (1986-07-01), Guttag et al.
patent: 4623255 (1986-11-01), Suszko
patent: 4727493 (1988-02-01), Taylor, Sr.
patent: 4766516 (1988-08-01), Ozdemir et al.
patent: 4799096 (1989-01-01), Koeppe
patent: 4821085 (1989-04-01), Haken et al.
patent: 4830974 (1989-05-01), Chang et al.
patent: 4939567 (1990-07-01), Kenney
patent: 4958222 (1990-09-01), Takakura et al.
patent: 4962484 (1990-10-01), Takeshima et al.
patent: 4975756 (1990-12-01), Haken et al.
patent: 4998151 (1991-03-01), Korman et al.
patent: 5030796 (1991-07-01), Swanson et al.
patent: 5050123 (1991-09-01), Castro
patent: 5061978 (1991-10-01), Mizutani et al.
patent: 5065208 (1991-11-01), Shah et al.
patent: 5068697 (1991-11-01), Noda et al.
patent: 5070378 (1991-12-01), Yamagata
patent: 5101121 (1992-03-01), Sourgen
patent: 5117276 (1992-05-01), Thomas et al.
patent: 5121089 (1992-06-01), Larson et al.
patent: 5121186 (1992-06-01), Wong et al.
patent: 5132571 (1992-07-01), McCollum et al.
patent: 5138197 (1992-08-01), Kuwana
patent: 5146117 (1992-09-01), Larson
patent: 5168340 (1992-12-01), Nishimura
patent: 5177589 (1993-01-01), Kobayashi et al.
patent: 5202591 (1993-04-01), Walden
patent: 5225699 (1993-07-01), Nakamura
patent: 5227649 (1993-07-01), Chapman
patent: 5231299 (1993-07-01), Ning et al.
patent: 5302539 (1994-04-01), Haken et al.
patent: 5308682 (1994-05-01), Morikawa
patent: 5309015 (1994-05-01), Kuwata et al.
patent: 5317197 (1994-05-01), Roberts
patent: 5336624 (1994-08-01), Walden
patent: 5341013 (1994-08-01), Koyanagi et al.
patent: 5345105 (1994-09-01), Sun et al.
patent: 5354704 (1994-10-01), Yang et al.
patent: 5369299 (1994-11-01), Byrne et al.
patent: 5371390 (1994-12-01), Mohsen
patent: 5376577 (1994-12-01), Roberts et al.
patent: 5384472 (1995-01-01), Yin
patent: 5399441 (1995-03-01), Bearinger et al.
patent: 5404040 (1995-04-01), Hshieh et al.
patent: 5412237 (1995-05-01), Komori et al.
patent: 5441902 (1995-08-01), Hsieh et al.
patent: 5468990 (1995-11-01), Daum
patent: 5475251 (1995-12-01), Kuo et al.
patent: 5506806 (1996-04-01), Fukushima
patent: 5531018 (1996-07-01), Saia et al.
patent: 5539224 (1996-07-01), Ema
patent: 5541614 (1996-07-01), Lam et al.
patent: 5571735 (1996-11-01), Mogami et al.
patent: 5576988 (1996-11-01), Kuo et al.
patent: 5611940 (1997-03-01), Zettler
patent: 5638946 (1997-06-01), Zavracky
patent: 5677557 (1997-10-01), Wuu et al.
patent: 5679595 (1997-10-01), Chen et al.
patent: 5719422 (1998-02-01), Burr et al.
patent: 5719430 (1998-02-01), Goto
patent: 5721150 (1998-02-01), Pasch
patent: 5783846 (1998-07-01), Baukus et al.
patent: 5821590 (1998-10-01), Lee et al.
patent: 5838047 (1998-11-01), Yamauchi et al.
patent: 5854510 (1998-12-01), Sur, Jr. et al.
patent: 5866933 (1999-02-01), Baukus et al.
patent: 5880503 (1999-03-01), Matsumoto et al.
patent: 5888887 (1999-03-01), Li et al.
patent: 5895241 (1999-04-01), Lu et al.
patent: 5920097 (1999-07-01), Horne
patent: 5930663 (1999-07-01), Baukus et al.
patent: 5930667 (1999-07-01), Oda
patent: 5973375 (1999-10-01), Baukus et al.
patent: 5977593 (1999-11-01), Hara
patent: 5998257 (1999-12-01), Lane et al.
patent: 6037627 (2000-03-01), Kitamura et al.
patent: 6046659 (2000-04-01), Loo et al.
patent: 6054659 (2000-04-01), Lee et al.
patent: 6057520 (2000-05-01), Goodwin-Johansson
patent: 6093609 (2000-07-01), Chuang
patent: 6117762 (2000-09-01), Baukus et al.
patent: 6137318 (2000-10-01), Takaaki
patent: 6154388 (2000-11-01), Oh
patent: 6165861 (2000-12-01), Liu et al.
patent: 6215158 (2001-04-01), Choi
patent: 6255155 (2001-07-01), Lee et al.
patent: 6294816 (2001-09-01), Baukus et al.
patent: 6326675 (2001-12-01), Scott et al.
patent: 6365453 (2002-04-01), Deboer et al.
patent: 0 186 855 (1986-07-01), None
patent: 0 364 769 (1990-04-01), None
patent: 0 463 373 (1992-01-01), None
patent: 0 528 302 (1993-02-01), None
patent: 0 585 601 (1994-03-01), None
patent: 0 764 985 (1997-03-01), None
patent: 0 883 184 (1998-12-01), None
patent: 0 920 057 (1999-06-01), None
patent: 1 193 758 (2002-04-01), None
patent: 1 202 353 (2002-05-01), None
patent: 2486717 (1982-01-01), None
patent: 58-190064 (1983-11-01), None
patent: 61-147551 (1986-07-01), None
patent: 63 129647 (1988-06-01), None
patent: 02-046762 (1990-02-01), None
patent: 02-237038 (1990-09-01), None
patent: 10-256398 (1998-09-01), None
patent: 98/21734 (1998-05-01), None
patent: 98/57373 (1998-12-01), None
patent: 00/44012 (2000-07-01), None
Document No. 02237038, dated Dec. 6, 1990, Patent Abstracts of Japan, vol. 014, No. 550 (E-1009).
Document No. 63129647, dated Jun. 2, 1988, Patent Abstracts of Japan, vol. 012, No. 385 (E-668), Oct. 14, 1998.
Patent Abstracts of Japan, vol. 016, No. 197 (p-1350) May 12, 1992 & JP-A-40 28 092 (Toshiba Corp), abstract.
Fredericksen, T.M., “A Multiple-Layer-Metal CMOS Process,”Intuitive CMOS Electronics, Revised Edition, Section 5.6, pp. 134-146 (1989).
Hodges and Jackson,Analysis and Design of Digital Integrated Circuits, 2nd edition, McGraw-Hill, p. 353 (1988).
Larson, L.E., et al., “Microactuators for GaAs-based Microwave Integrated Circuits,”IEEE, pp. 743-746 (1991).
Lee, “Engineering a Device for Electron-beam Probing,”IEEE Design and Test of Computers, pp. 36-49 (1989).
Sze, S.M., ed.VLSI Technology, McGraw-Hill, pp. 99, 447, and 461-465 (1983).
Sze, S.M., ed., “Silicides for Gates and Interconnections,”VLSI Technology, McGraw-Hill, pp. 372-380 (1983).
United Kingdom Examination Report for the corresponding United Kingdom Application No. GB0316906.7, issued on Feb. 10, 2005 (3 pages).
Blythe, et al., “Layout Reconstruction of Complex Silicon Chips,”IEEE Journal of Solid-State Circuits, pp. 138-145 (Feb. 1993).
Ng, K.K.,Complete Guide to Semiconductor Devices, McGraw-Hill, Inc., pp. 164-165 (1995).
IBM—TDB, “Double Polysilicon Dynamic Memory Cell with Polysilicon Bit Line,” pp. 3828-3831 (Feb. 1979).
IBM—TDB, “Static Ram Double Polysilicon Process,” pp. 3683-3686 (Jan. 1981).

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