Integrated circuits for testing an active matrix display array

Details Integrated circuits for testing an active matrix display array Integrated circuits for testing an active matrix display array

2005-09-06

2005-09-06

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S1540PB

Reexamination Certificate

active

06940300

ABSTRACT:
A device for use in a display system including an array of pixel cells formed on a substrate. Each pixel cell being coupled to at least one gate line of a plurality of gate lines formed on the substrate and at least one data line of a plurality of data lines being formed on the substrate. The device includes first and second transistors formed on the substrate. Each transistor has a gate electrode and first and second electrodes defining a serpentine channel region there between voltage applied to the gate electrode controls conductivity of the channel region. Preferably, a common electrode includes one of the first and second electrodes of the first transistor and one of the first and second electrodes of the second transistor. The first and second transistors are preferably coupled between a gate line (or data line) and respective probe pads formed on the substrate and selectively couple the respective probe pad to the gate line (or data line) during a test routine whereby charge is written to, stored, and read from the array of pixel cells.

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