Integrated circuits, carriers therefor and testing apparatus and

Details Integrated circuits, carriers therefor and testing apparatus and Integrated circuits, carriers therefor and testing apparatus and

1986-09-02

1988-12-13

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

324 73PC, 371 25, G01R 3128, G01R 3102

Patent

active

047913584

ABSTRACT:
A method of testing an interconnection function between two integrated circuits which are mounted on a carrier and which are interconnected by data connections, for example a printed wiring board, is disclosed. The integrated circuits are also connected to a serial bus via which test patterns and result patterns can be communicated between a test device which can be connected thereto and the respective integrated circuits. The bus of a preferred embodiment is formed by a so-called I.sup.2 C bus. In a further elaboration, this set-up can also be used for testing the internal logic circuitry of the integrated circuits. For the testing of the interconnection function, input/output cells with a parallel connection for performing the normal execution function in a transparent mode are provided. They also include series connections for communication test/result patterns by way of a shift register.

REFERENCES:
patent: 4244048 (1981-01-01), Tsui
patent: 4479088 (1984-10-01), Stopper

Affiliated with

Also associated with

Rating

Integrated circuits, carriers therefor and testing apparatus and does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated circuits, carriers therefor and testing apparatus and, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuits, carriers therefor and testing apparatus and will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2198188