Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2008-09-23
2008-09-23
Tsai, Carol S (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C700S087000, C365S189050, C365S189120, C365S063000, C326S037000, C326S038000
Reexamination Certificate
active
11465583
ABSTRACT:
An integrated circuit (IC) includes a micro control unit (MCU), a one-time programmable (OTP) memory directly connected with the MCU, an electrical charge pump having an output port and an enable port connected to the MCU, and a switching circuit having a control port connected to the MCU, a first input port connected to the output port of the electrical charge pump, a second input port connected to a power source of the MCU, and an output port connected to the OTP memory to provide an operating voltage and a recording voltage for the OTP memory. Because the OTP memory can choose the operating voltage or the recording voltage, a measuring apparatus using this IC doesn't need an external power source to provide a VDD voltage being 5.8 volts. Therefore, a power consuming of the IC can be reduced.
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Chao Po-Yin
Lin Hsiang-Min
Yuan Kuo-Yuan
Fortune Semiconductor Corporation
Tsai Carol S
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