Integrated circuit with improved pre-metal planarization

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257760, 257774, 257915, H01L23/48

Patent

active

059030542

ABSTRACT:
An integrated circuit wherein a planarization step has been performed before the primary metal deposition step, but after deposition of the adhesion and barrier layers. Thus the adhesion and barrier layers are present on the sidewalls of contact holes, but do not underlie the whole extent of the primary metallization.

REFERENCES:
patent: 4884123 (1989-11-01), Dixit et al.
patent: 5049975 (1991-09-01), Ajika et al.
patent: 5061985 (1991-10-01), Meguro et al.
patent: 5081515 (1992-01-01), Murata et al.
patent: 5124780 (1992-06-01), Sandhu et al.
patent: 5164330 (1992-11-01), Davis et al.
patent: 5233217 (1993-08-01), Dixit et al.
patent: 5356836 (1994-10-01), Chen et al.
patent: 5421974 (1995-06-01), Witt
patent: 5486492 (1996-01-01), Yamamoto et al.
Translation of Japan Kokai Publication #01-0140768 (Jun. 1989) to Shinohara, 10 pages.
S. Wolf, Silicon Processing for the VLSI Era, vol. 2 Lattice Press, 1990, p. 128.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Integrated circuit with improved pre-metal planarization does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated circuit with improved pre-metal planarization, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit with improved pre-metal planarization will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-247248

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.