Integrated circuit with improved monitoring function by use of b

Details Integrated circuit with improved monitoring function by use of b Integrated circuit with improved monitoring function by use of b

1985-09-06

1989-01-24

Macon, Robert S.

357 13, H01L 2348

Patent

active

048004189

ABSTRACT:
A semiconductor integrated circuit of the type having at least one reference element fabricated on a semiconductor chip on which functional elements are formed is obtained by a high integration structure. The reference element is coupled through a switching element to a bonding pad to which a part of the functional elements is connected. The switching element assumes a non-conductive state when the functional elements operate and a conductive state when a voltage applied thereto is outside the normal operating voltage of the functional elements.

REFERENCES:
patent: 4694315 (1987-09-01), Svedberg

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