Integrated circuit with fuse programming damage detection

Details Integrated circuit with fuse programming damage detection Integrated circuit with fuse programming damage detection

2006-06-08

2009-10-06

Nguyen, Vincent Q (Department: 2831)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S537000, C365S225700, C365S201000, C257S529000

Reexamination Certificate

active

07598749

ABSTRACT:
An integrated circuit with an efuse having an efuse link includes a damage detection structure disposed in relation to the efuse so as to detect damage in the IC resulting from programming the efuse. Damage sensing circuitry is optionally included on the IC. Embodiments are used in evaluation wafers to determine proper efuse fabrication and programming parameters, and in production ICs to identify efuse programming damage that might create a latent defect.

REFERENCES:
patent: 6201406 (2001-03-01), Iwanczuk et al.
patent: 6462998 (2002-10-01), Proebsting
patent: 7009443 (2006-03-01), Illegems
patent: 7321522 (2008-01-01), Dixon et al.
patent: 2006/0131743 (2006-06-01), Erickson et al.

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