Integrated circuit with built-in self test circuit

Details Integrated circuit with built-in self test circuit Integrated circuit with built-in self test circuit

2011-06-28

2011-06-28

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762010, C324S073100

Reexamination Certificate

active

07969168

ABSTRACT:
An embodiment of the invention provides an integrated circuit. The integrated circuit has an analog device-under-test (DUT), a memory receiving and storing a test program and a processor. The processor tests the analog DUT and outputs a test result in digital format by executing the test program, wherein the test result indicates whether the analog DUT workable according to a specification.

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