Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device
Reexamination Certificate
2006-11-14
2006-11-14
Pham, Long (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Reexamination Certificate
active
07135723
ABSTRACT:
An integrated circuit with a test circuit having a measurement converter circuit and an activation unit. The measurement converter circuit converts one or more circuit-internal signals into a measured value. The activation unit activates the measurement converter circuit in accordance with an activation signal. The measurement converter circuit and the activation unit are connected to a connection pad. The activation unit is configured in such a way as to switch on the measurement converter circuit by means of the activation signal received via the connection pad. The measured value can be tapped off via the connection pad.
REFERENCES:
patent: 5332973 (1994-07-01), Brown et al.
patent: 6518900 (2003-02-01), Oehler et al.
patent: 6907555 (2005-06-01), Nomura et al.
Pfeiffer Johann
Szczpinski Kazimierz
Infineon - Technologies AG
Patterson & Sheridan L.L.P.
Pham Long
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