Integrated circuit utilizing an air gap to reduce capacitance be

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified configuration

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257735, 257775, 257776, H01L 2972

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active

061603163

ABSTRACT:
A method is provided for forming a multi-level interconnect in which capacitive coupling between laterally adjacent conductors employed by an integrated circuit is reduced. According to an embodiment, a conductor is dielectrically spaced above a semiconductor substrate, and a masking structure is arranged upon an upper surface of the conductor. Select portions of the conductor are removed such that opposed ends of the masking structure extend beyond opposed sidewall surfaces of the conductor. An interlevel dielectric is deposited to a level above the masking structure such that air gaps are formed laterally adjacent the opposed sidewall surfaces of the conductor, and the interlevel dielectric is planarized to a level spaced above an upper surface of the masking structure.

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