Integrated circuit transfer test device system

Details Integrated circuit transfer test device system Integrated circuit transfer test device system

1987-05-20

1988-10-18

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Plural, automatically sequential tests

324 73R, 324158R, G01R 3104, G01R 3102

Patent

active

047790415

ABSTRACT:
The system is for testing semiconductor components such as TTL components and CMOS components to determine whether the input, output and ground pins are conductively connected to a circuit, such as the circuit of a printed circuit board, and whether proper conductive paths exist between the connector pins and the ground pin through the semiconductor. This is accomplished by providing a current pulse on one terminal to generate a voltage drop across an inherent resistance of the component which is connected in series with the other terminal of the component and detecting the resulting voltage drop. The existence of the voltage drop indicates that both the input and output terminals, as well as the ground terminal, are properly connected to the printed circuit board.

REFERENCES:
patent: 3969670 (1976-07-01), Wu
patent: 4595875 (1986-06-01), Chan et al.
patent: 4638243 (1987-01-01), Chan
patent: 4670708 (1987-06-01), Boszyak et al.
patent: 4697139 (1987-09-01), Gal
patent: 4727317 (1988-02-01), Oliver
"Load-Driver Error Isolation", by Arter et al, IBM Tech. Disc. Bull., vol. 21, #6, 11/78, pp. 2243-2244.

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