Integrated circuit timing debug apparatus and method

Details Integrated circuit timing debug apparatus and method Integrated circuit timing debug apparatus and method

2005-06-07

2005-06-07

Nguyen, Linh My (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Synchronizing

C714S731000

Reexamination Certificate

active

06903582

ABSTRACT:
A timing debug tool for an IC that enables varying the skew of selected edges of a primary clock signal for a controllable number of clock cycles. The debug tool enables identification, isolation and analysis of timing problems on the IC. An IC including programmable clock skew logic that applies a programmed skew amount to selected edges of a clock signal. A debug system including clock control logic further including a delay block and test logic. The delay block delays a selected number of transitions of a first clock signal to provide a second clock signal, where each selected transition of the second clock signal is delayed, based on a sync signal, by either one of a default skew amount and a programmed skew amount. The test logic enables dynamic control of the sync signal and dynamic programming of the selected skew amount.

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patent: 6192092 (2001-02-01), Dizon et al.
patent: 6289068 (2001-09-01), Hassoun et al.
patent: 6647081 (2003-11-01), Butler et al.

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