Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-08-30
2005-08-30
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
06937051
ABSTRACT:
An integrated circuit can be tested externally at its normal signal output pin(s) without requiring additional testing output pins or test measuring pads. The integrated circuit includes a circuit unit that generates a normal output signal provided to the signal output pin in a normal operating mode and generates a test signal in a testing mode, a switching element that selectively does or does not connect the test signal from the circuit unit to the signal output pin, and a control unit that controls the switching element with a control signal responsive to the potential level present at the signal output pin. When the circuit is to be tested, a defined voltage is applied to the signal output pin by a voltage divider formed of resistors between a supply voltage and a reference voltage. This causes the control unit to close the switching element.
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Eichin Matthias
Kurz Alexander
Atmel Germany GmbH
Fasse W. F.
Fasse W. G.
Hollington Jermele
Vishay Semiconductor GmbH
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