Integrated circuit testing probe

Details Integrated circuit testing probe Integrated circuit testing probe

1978-02-24

1980-07-22

Rolinec, Rudolph V.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, G01R 106

Patent

active

042142016

ABSTRACT:
Multi-tipped probe for testing integrated circuit elements, featuring, in various aspects, contact elements each resiliently biased in a rest position with a portion of itself spaced from a support and movable to an operating position against the support, the element tips being coplanar in the operating position; and contact elements having end portions oblique to an axis of the support and having peripheral edges at their ends for contacting the lead with the axis parallel to the lead.

REFERENCES:
patent: 3447078 (1969-05-01), Levy
patent: 3609539 (1971-09-01), Gunthert
patent: 3611128 (1971-10-01), Nagata
patent: 3702439 (1972-11-01), McGahey et al.
patent: 3806800 (1974-04-01), Bove et al.
patent: 3899233 (1975-08-01), Sigel et al.
patent: 3939414 (1976-02-01), Roch
patent: 3992073 (1976-11-01), Buchoff et al.
patent: 4035723 (1977-07-01), Kvaternik
patent: 4065717 (1977-12-01), Kattner et al.
"2220 Bug Hound Fault Tracer"; General Radio Brochure; General Radio, Concord, Mass. (no date).

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