Integrated circuit testing module including address generator

Details Integrated circuit testing module including address generator Integrated circuit testing module including address generator

2006-03-07

2008-11-04

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S073100

Reexamination Certificate

active

07446551

ABSTRACT:
Systems and methods of testing integrated circuits are disclosed. The systems include a test module configured to operate between an automated testing equipment and an integrated circuit to be tested. The testing interface is configured to test the integrated circuit at a higher clock frequency than the automated testing equipment is configured to operate. In order to do so, the testing interface includes components configured for generating addresses and test data to be provided to the integrated circuit. A variety of test data patterns can be produced and the test data can be address dependent.

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U.S. Appl. No. 11/552,944, Adrian Ong, Intergrated Circuit Testing Module Configured for Set-up and Hold Time Testing, filed Oct. 25, 2006.
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