Integrated circuit testing fixture

Details Integrated circuit testing fixture Integrated circuit testing fixture

1991-09-18

1992-12-29

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158P, 439 91, G01R 3100

Patent

active

051754916

ABSTRACT:
A test fixture is provided for simultaneously performing burn-in and testing of multiple integrated circuit devices. The packaged integrated circuits rest on electrical contacts without sockets. A top plate of the fixture holds all of the devices in place. The use of a compressible material allows for variations in package size, lead length, and socket wear while still maintaining good electrical connection. Leads are connected through the test substrate to the backside and the devices may be connected in parallel or otherwise as desired.

REFERENCES:
patent: 3877064 (1975-04-01), Scheingold et al.
patent: 4324040 (1982-04-01), Gottlieb
patent: 4766371 (1988-08-01), Moriya
patent: 4899107 (1990-02-01), Corbett et al.
patent: 5086269 (1992-02-01), Nobi

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