Integrated circuit testing device and a method of use therefor

Details Integrated circuit testing device and a method of use therefor Integrated circuit testing device and a method of use therefor

2005-03-29

2005-03-29

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S763010, C324S765010

Reexamination Certificate

active

06873146

ABSTRACT:
The present invention provides an integrated circuit testing device200and a method of using the same. In one particular embodiment, the integrated circuit testing device may include a first circuit layer220located over a semiconductor substrate210, wherein the first circuit layer220has a second circuit layer230located thereover. The integrated circuit testing device200of the same embodiment may further include a signal bond pad240selectively connectable to each of the first and second circuit layers220, 230to test at least one device on each of the first and second circuit layers220, 230.

REFERENCES:
patent: 3983479 (1976-09-01), Lee et al.
patent: 4725773 (1988-02-01), Lieneweg
patent: 5051690 (1991-09-01), Maly et al.
patent: 6061814 (2000-05-01), Sugasawara et al.
patent: 6452412 (2002-09-01), Jarvis et al.

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