Integrated circuit testing device

Details Integrated circuit testing device Integrated circuit testing device

1998-03-05

2000-09-12

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324537, G01R 3126, G01R 313183

Patent

active

06118294&

ABSTRACT:
The invention is an integrated circuit testing device for testing whether a plurality of unknown data stored in a device under test are identical. A test pattern generated by a pattern generator 1 is supplied to a device under test 5 through drivers 3, as a result of which unknown data 5-1 obtained from the device under test 5 are sent through a comparator 4 and a judgment circuit 6 to be stored in an expected value memory 7 as a dummy expected value pattern. Thereafter, further unknown data 5-2, 5-3, . . . are sequentially read from the device under test 5 to collate them with the unknown data 5-1 in the expected value memory 7 by means of the judgment circuit 6.

REFERENCES:
patent: 5146161 (1992-09-01), Kiser
patent: 5241364 (1993-08-01), Nishiura
patent: 5590137 (1996-12-01), Yamashita

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