Integrated circuit testing apparatus and method

Details Integrated circuit testing apparatus and method Integrated circuit testing apparatus and method

1992-11-12

1996-03-26

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324755, G01R 3102

Patent

active

055023975

ABSTRACT:
Disclosed is a method and apparatus for the testing of an integrated circuit which is packaged in a housing with leads projecting from the housing and contact elements disposed along one or more of the surfaces of the housing. In the apparatus a plurality of electrical or electronic devices may be temporarily connected to the contact elements during testing of the integrated circuit at an automatic handler test station.

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