Integrated circuit testing apparatus

Details Integrated circuit testing apparatus Integrated circuit testing apparatus

1981-04-08

1984-05-22

Strecker, Gerard R.

Electricity: measuring and testing

Plural, automatically sequential tests

G01R 3128

Patent

active

044504020

ABSTRACT:
An integrated testing apparatus provides bidirectional coupling of a high voltage either from an internal source on an integrated circuit to a first external pin on the integrated circuit package, or to the output point of said internal source of high voltage from a voltage source external to the integrated circuit package that is coupled to said first external pin, said coupling occurring in response to an enabling signal externally impressed on a second external pin on said integrated circuit package. The testing apparatus is substantially transparent to normal integrated circuit operation when said enabling signal is removed from said second external pin.

REFERENCES:
patent: 4336495 (1982-06-01), Hapke
patent: 4339710 (1982-07-01), Hapke
patent: 4357703 (1982-11-01), Van Brunt
Harrod, R. D., Shunting Technique for Testing Electronic Circuitry, IBM Technical Disclosure Bulletin, vol. 18, No. 1, Jun. 1975, pp. 204, 205.

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