Integrated circuit testing

Details Integrated circuit testing Integrated circuit testing

1997-01-09

1998-09-15

Nguyen, Hoa T.

Excavating

364490, G01R 3128, G06F 1500

Patent

active

058090371

ABSTRACT:
A system for the debugging of integrated circuit designs containing a plurality of macrocells A, B and C utilises multiplexers 68, 70 and 72 associated with external output connections to select either a normal external output signal or a diagnostic internal signal. In operation, a primary integrated circuit and a tracking integrated circuit are supplied with identical input signals and so adopt identical states. The primary integrated circuit selects the normal external output signals whilst the tracking integrated circuit selects for diagnostic purposes predetermined internal signals. A further tracking integrated circuit 74 may be provided that corresponds to one of the macrocells A within the primary integrated circuit and the tracking integrated circuit to provide further details of the operation of this macrocell.

REFERENCES:
patent: 4862072 (1989-08-01), Harris et al.
patent: 5331571 (1994-07-01), Aronoff et al.
patent: 5717695 (1998-02-01), Manela et al.

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